13th Seminar on Quantitative Microscopy (QM)
9th Seminar on Nanoscale
Calibration, Standards and Methods
|The white cathedral of Helsinki||Senate Square||Evening view to Market Square from the sea|
NanoScale 2023 took place in the conference centre Technopolis Ruoholahti (location map) in the West of the centre of Helsinki, just 2 km from the heart of the town (i. e. from Market Square, Cathedral, Esplanades...) from October 10th to 12th, 2023. After a break of 4 years due to the Covid-19 pandemic, it was generally appreciated that the conference was fully in person (with one hybrid session as open stakeholder meeting).
Who would like to host the next NanoScale, currently scheduled for autumn 2026?
Please contact the NanoScale office until Dec 15th, 2023, if your institute is interested.
106 participants from 24 countries on all continents took part at NanoScale in Helsinki.
This is about as man as in the record-year 2019!
Warm thanks to all participants for their inspiring scientific exchange and so many good conversations!
A total of 83 presentations were given - Many thanks to all authors!
31 oral presentations, 52 posters (see program at a glance - pdf)
As by far more abstracts for oral presentation had been submitted, the Scientific Committee reviewed all abstracts for talks based on a scoring system to decide whether these papers are accepted as a talk or as a poster.
In addition to the scientific talks and posters, an excursion to the VTT MIKES labs was organized on Thursday afternoon. Please see Program for details. Further lab tours were offered in conjunction with the other meetings of the Length Metrology Week on other days. We thank our colleagues at VTT MIKES for hosting so many groups of guests in their labs.
NanoScale 2023 included Special Sessions on "High-speed SPM measurements of functional properties of nanostructures" and "3D roughness & dimensional measurements using optical 3D microsopy and optical distance sensors" (EMPIR projects 20IND08 MetExSPM and 20IND07 TracOptic). Lab tours to the metrology labs of VTT MIKES on the Otaniemi campus in Espoo were offered to the participants, too.
All submissions are included in the Book of Abstracts that was handed out to the participants upon check-in and made available to them for download as pdf-file.
NanoScale offers peer-reviewed publication of full papers in a (virtual) Special Issue of Measurement Science and Technology (MST) to all authors of NanoScale 2023. As so-called Transformative and Institutional Open Access Agreements have been concluded recently, most authors can publish in MST on an open access basis at no cost to themselves.
Please write your manuscript according to the rules applicable for MST and submit it on the MST submission interface and select “NanoScale 2023” from the drop-down menu at the bottom of step 1
Deadline for submission: December 15th, 2023
Once published, all NanoScale participants will be granted free access to all papers (incl. those that are not open access) of this Special Issue for a given time.
|National Metrology Institute VTT MIKES|
Teknologian tutkimuskeskus VTT Oy
VTT Technical Research Centre of Finland Ltd
|Physikalisch-Technische Bundeanstalt (PTB)|
National Metrology Institute of Germany
|BIPM Consultative Committee Length|
Working Group Nanometrology (CCL-WG-N)
Promoting progress in metrology
|EMPIR-Project 20IND07 TracOptic|
Traceable industrial 3D roughness and dimensional measurement using optical 3D microsopy and optical distance sensors
|EMPIR-Project 20IND08 MetExSPM|
Traceability of localised functional properties of nanostructures with high speed scanning probe microscopy
|Both 20IND07 TracOptic and 20IND08 MetExSPM are Joint Research Projects within the European Metrology Research Programme EMPIR|